tfr3n,TFR3T 2002-09-18 1 toshiba fast recovery diode silicon diffused type tfr3n,TFR3T strobo flasher applications (fast recovery) average forward current: i f (av) = 0.2 a repetitive peak reverse voltage: v rrm = 1000, 1500 v reverse recovery time: t rr = 1.5 s maximum ratings (ta 25c) characteristics symbol rating unit tfr3n 1000 repetitive peak reverse voltage TFR3T v rrm 1500 v average forward current i f (av) 0.2 a i 2 t limit value (t 1 to 10 ms) i 2 t 0.5 a 2 s 10 (50 hz) peak one cycle surge forward current (non repetitive) i fsm 11 (60 hz) a junction temperature t j 40 to 125 c storage temperature range t stg 40 to 125 c electrical characteristics (ta 25c) characteristics symbol test condition min typ. max unit peak forward voltage v fm i fm 0.1 a 1.5 v repetitive peak reverse current i rrm v rrm rated 5 a reverse recovery time t rr i f 10 ma, i r 10 ma 1.5 s marking unit: mm jedec D jeita D toshiba 3-3e1a weight: 0.225 g (typ.) type code lot no. cathode mark color: silver month (starting from alphabet a) year (last number of the christian era) code type fr3n tfr3n fr3t TFR3T f r 3 t
tfr3n,TFR3T 2002-09-18 2 peak surge forward current i fsm (a) number of cycles surge forward current (non-repetitive) instantaneous forward voltage v f (v) i f ? v f instantaneous forward current i f (ma) average forward current i f (av) (ma) ta m ax ? i f (av) maximum allowable temperature ta max (c) 3000 3.2 1000 500 300 50 30 0.8 1.2 1.6 2.0 2.8 0.4 10 2.4 100 25 t j 125c 200 0 0 160 120 80 40 40 80 120 160 200 280 240 12 0 1 8 6 4 2 3 10 30 100 10 t j 25c 60 hz 50 hz
tfr3n,TFR3T 2002-09-18 3 toshiba is continually working to improve the quality and reliability of its products. nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. it is the responsibility of the buyer, when utilizing toshiba products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such toshiba products could cause loss of human life, bodily injury or damage to property. in developing your designs, please ensure that toshiba products are used within specified operating ranges as set forth in the most recent toshiba products specifications. also, please keep in mind the precautions and conditions set forth in the ?handling guide for semiconductor devices,? or ?toshiba semiconductor reliability handbook? etc.. the toshiba products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). these toshiba products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (?unintended usage?). unintended usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. unintended usage of toshiba products listed in this document shall be made at the customer?s own risk. the information contained herein is presented only as a guide for the applications of our products. no responsibility is assumed by toshiba corporation for any infringements of intellectual property or other rights of the third parties which may result from its use. no license is granted by implication or otherwise under any intellectual property or other rights of toshiba corporation or others. the information contained herein is subject to change without notice. 000707ea a restrictions on product use
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